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  • No : 5697
  • Date of Issue : 2021/04/28 13:46
  • Last Updated : 2021/05/20 08:57
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(EDX) Plating film thickness measurement (multiple layers)

I would like to perform a quantitative analysis of a plating. Can the film thickness be measured if the same element is spread across multiple layers?
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Answer

• There is no way to specify what layer generated the fluorescent X-rays, and so analysis is not possible if all of the layers are unknown.
• If there is 1 unknown layer, and the remaining layers are known (both film thickness and composition), then analysis may be possible if you enter fixed values for the known layers.

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